Notice Information
Notice Title
Semiconductor Lifetest Equipment
Notice Description
NPL and the University of Glasgow will work together to establish a service for Burn-in and Life-testing of semiconductor laser diodes in high-volume for manufacturers and suppliers of laser diodes. The requirements for such a system are as follows: Essential: * TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month * Life-test duration > 10,000 hours * Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module * Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC) * Bar test - Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test. * Optical detector to monitor light output of each device under test * Wavelength range from 400 nm - 1600 nm * Temperature sensor at each device for close monitoring * Independent current drive for each device * Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future "non-standard" testing requests * Low noise, highly stable current driver for each device (<0.1mA RMS noise) * Stable temperature during life-test (no variation > 1degC) * Remote access to monitor and control system software
Lot Information
Lot 1
The requirements for such a system are as follows: Essential: * TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month * Life-test duration > 10,000 hours * Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module * Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC) * Bar test - Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test. * Optical detector to monitor light output of each device under test * Wavelength range from 400 nm - 1600 nm * Temperature sensor at each device for close monitoring * Independent current drive for each device * Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future "non-standard" testing requests * Low noise, highly stable current driver for each device (<0.1mA RMS noise) * Stable temperature during life-test (no variation > 1degC) * Remote access to monitor and control system software
Procurement Information
YELO is the only company to manufacture and to sell an industrial burn-in and lifetest system able to test at hight-volume TO-cans, chip-on-carrier and bar in one modular system, with independent current driver for each device, temperature sensors at each device, and oven temperatures up to 150degC. The exclusive design of the YELO Y1000 system allows testing of a wide range of semiconductor laser devices with designs that are still under development. These requirements are all essential for our use due to specific customer requests. Furthermore, these requirements are aligned to what is existing operations at the Compound Semiconductor Applications Catapult (CSAC) - a partner organisation whom NPL and the University of Glasgow closely interact with on Burn-in and Reliability of laser diodes.
Notice Details
Publication & Lifecycle
- Open Contracting ID
- ocds-h6vhtk-0398be
- Publication Source
- Find A Tender Service
- Latest Notice
- https://www.find-tender.service.gov.uk/Notice/001637-2023
- Current Stage
- Award
- All Stages
- Award
Procurement Classification
- Notice Type
- Award Notice
- Procurement Type
- Standard
- Procurement Category
- Goods
- Procurement Method
- Limited
- Procurement Method Details
- Award procedure without prior publication of a call for competition
- Tender Suitability
- Not specified
- Awardee Scale
- SME
Common Procurement Vocabulary (CPV)
- CPV Divisions
38 - Laboratory, optical and precision equipments (excl. glasses)
-
- CPV Codes
38000000 - Laboratory, optical and precision equipments (excl. glasses)
Notice Value(s)
- Tender Value
- Not specified
- Lots Value
- Not specified
- Awards Value
- Not specified
- Contracts Value
- £350,000 £100K-£500K
Notice Dates
- Publication Date
- 19 Jan 20233 years ago
- Submission Deadline
- Not specified
- Future Notice Date
- Not specified
- Award Date
- 19 Jan 20233 years ago
- Contract Period
- Not specified - Not specified
- Recurrence
- Not specified
Notice Status
- Tender Status
- Complete
- Lots Status
- Not Specified
- Awards Status
- Active
- Contracts Status
- Active
Buyer & Supplier
Contracting Authority (Buyer)
- Main Buyer
- NATIONAL PHYSICAL LABORATORY
- Contact Name
- Not specified
- Contact Email
- nina.heath@npl.co.uk
- Contact Phone
- Not specified
Buyer Location
- Locality
- TEDDINGTON
- Postcode
- TW11 0LW
- Post Town
- Twickenham
- Country
- England
-
- Major Region (ITL 1)
- TLI London
- Basic Region (ITL 2)
- TLI7 Outer London - West and North West
- Small Region (ITL 3)
- TLI75 Hounslow and Richmond upon Thames
- Delivery Location
- Not specified
-
- Local Authority
- Richmond upon Thames
- Electoral Ward
- Teddington
- Westminster Constituency
- Twickenham
Further Information
Notice URLs
Open Contracting Data Standard (OCDS)
View full OCDS Record for this contracting process
The Open Contracting Data Standard (OCDS) is a framework designed to increase transparency and access to public procurement data in the public sector. It is widely used by governments and organisations worldwide to report on procurement processes and contracts.
{
"tag": [
"compiled"
],
"id": "ocds-h6vhtk-0398be-2023-01-19T10:25:02Z",
"date": "2023-01-19T10:25:02Z",
"ocid": "ocds-h6vhtk-0398be",
"initiationType": "tender",
"tender": {
"id": "ocds-h6vhtk-0398be",
"legalBasis": {
"id": "32014L0024",
"scheme": "CELEX"
},
"title": "Semiconductor Lifetest Equipment",
"status": "complete",
"classification": {
"scheme": "CPV",
"id": "38000000",
"description": "Laboratory, optical and precision equipments (excl. glasses)"
},
"mainProcurementCategory": "goods",
"description": "NPL and the University of Glasgow will work together to establish a service for Burn-in and Life-testing of semiconductor laser diodes in high-volume for manufacturers and suppliers of laser diodes. The requirements for such a system are as follows: Essential: * TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month * Life-test duration > 10,000 hours * Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module * Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC) * Bar test - Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test. * Optical detector to monitor light output of each device under test * Wavelength range from 400 nm - 1600 nm * Temperature sensor at each device for close monitoring * Independent current drive for each device * Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future \"non-standard\" testing requests * Low noise, highly stable current driver for each device (<0.1mA RMS noise) * Stable temperature during life-test (no variation > 1degC) * Remote access to monitor and control system software",
"lots": [
{
"id": "1",
"description": "The requirements for such a system are as follows: Essential: * TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month * Life-test duration > 10,000 hours * Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module * Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC) * Bar test - Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test. * Optical detector to monitor light output of each device under test * Wavelength range from 400 nm - 1600 nm * Temperature sensor at each device for close monitoring * Independent current drive for each device * Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future \"non-standard\" testing requests * Low noise, highly stable current driver for each device (<0.1mA RMS noise) * Stable temperature during life-test (no variation > 1degC) * Remote access to monitor and control system software",
"awardCriteria": {
"criteria": [
{
"name": "Technical",
"type": "cost",
"description": "70%"
},
{
"name": "Commercial",
"type": "cost",
"description": "30%"
}
]
},
"hasOptions": false
}
],
"items": [
{
"id": "1",
"deliveryAddresses": [
{
"region": "UK"
}
],
"deliveryLocation": {
"description": "NPL Management Ltd Hampton Road Teddington TW11 0LW"
},
"relatedLot": "1"
}
],
"procurementMethod": "limited",
"procurementMethodDetails": "Award procedure without prior publication of a call for competition",
"coveredBy": [
"GPA"
],
"procurementMethodRationaleClassifications": [
{
"scheme": "TED_PT_AWARD_CONTRACT_WITHOUT_CALL",
"id": "D_OUTSIDE_SCOPE",
"description": "The procurement falls outside the scope of application of the directive"
}
],
"procurementMethodRationale": "YELO is the only company to manufacture and to sell an industrial burn-in and lifetest system able to test at hight-volume TO-cans, chip-on-carrier and bar in one modular system, with independent current driver for each device, temperature sensors at each device, and oven temperatures up to 150degC. The exclusive design of the YELO Y1000 system allows testing of a wide range of semiconductor laser devices with designs that are still under development. These requirements are all essential for our use due to specific customer requests. Furthermore, these requirements are aligned to what is existing operations at the Compound Semiconductor Applications Catapult (CSAC) - a partner organisation whom NPL and the University of Glasgow closely interact with on Burn-in and Reliability of laser diodes."
},
"awards": [
{
"id": "001637-2023-1",
"relatedLots": [
"1"
],
"status": "active",
"hasSubcontracting": true,
"suppliers": [
{
"id": "GB-FTS-73197",
"name": "Yelo Ltd."
}
]
}
],
"parties": [
{
"id": "GB-FTS-155",
"name": "National Physical Laboratory",
"identifier": {
"legalName": "National Physical Laboratory"
},
"address": {
"streetAddress": "Hampton Road",
"locality": "Teddington",
"region": "UK",
"postalCode": "TW11 0LW",
"countryName": "United Kingdom"
},
"contactPoint": {
"email": "nina.heath@npl.co.uk"
},
"roles": [
"buyer"
],
"details": {
"url": "http://www.npl.co.uk",
"classifications": [
{
"scheme": "TED_CA_TYPE",
"id": "BODY_PUBLIC",
"description": "Body governed by public law"
},
{
"scheme": "COFOG",
"description": "Research"
}
]
}
},
{
"id": "GB-FTS-73197",
"name": "Yelo Ltd.",
"identifier": {
"legalName": "Yelo Ltd."
},
"address": {
"streetAddress": "Trooperslane Industrial Estate 20 Meadowbank Road",
"locality": "Carrickfergus",
"region": "UKN",
"postalCode": "BT38 8YF",
"countryName": "United Kingdom"
},
"roles": [
"supplier"
],
"details": {
"scale": "sme"
}
},
{
"id": "GB-FTS-156",
"name": "NPL Management Ltd",
"identifier": {
"legalName": "NPL Management Ltd"
},
"address": {
"streetAddress": "Hampton Road",
"locality": "Teddington",
"postalCode": "TW11 0LW",
"countryName": "United Kingdom"
},
"roles": [
"reviewBody",
"mediationBody"
]
}
],
"buyer": {
"id": "GB-FTS-155",
"name": "National Physical Laboratory"
},
"contracts": [
{
"id": "001637-2023-1",
"awardID": "001637-2023-1",
"status": "active",
"value": {
"amount": 350000,
"currency": "GBP"
},
"dateSigned": "2023-01-19T00:00:00Z"
}
],
"language": "en"
}