This public procurement record has 2 releases in its history.

Award

10 Jan 2018 at 00:00

Tender

09 Aug 2017 at 01:00

Summary of the contracting process

The University of Edinburgh is conducting a tender process for the procurement of a Cryo-Focused Ion Beam/Scanning Electron Microscope with EDX/EBSD Detectors, located in Edinburgh, Scotland. This procurement is classified under the goods category, particularly in the education sector. The procurement method is open, allowing a wider range of suppliers to participate. The submission period for tenders ended on 11th September 2017, with the award period beginning shortly after. This initiative aims to support a multi-user facility focused on advancing research in materials science.

This procurement presents significant opportunities for businesses specialising in scientific equipment manufacturing, particularly those with expertise in advanced imaging technologies. Companies that can demonstrate prior experience in supplying similar or complex equipment, and who meet the financial and technical selections criteria outlined by the University, would be particularly well-positioned to compete. Furthermore, those capable of providing comprehensive after-sales service, including installation and training, will likely find this tender attractive, potentially leading to long-term partnerships with the University of Edinburgh.

How relevant is this notice?

Notice Title

Cryo-Focused Ion Beam/Scanning Electron Microscope with EDX/EBSD Detectors

Notice Description

University of Edinburgh invites competitive tenders for the supply of a Focused Ion Beam/Scanning Electron Microscope with EDX Detector, Cryo-Stage and TEM Cryo Transfer. Bidders must self-certify their adherence to selection and exclusion criteria via the ESPD (Scotland) on PCS-T.Suppliers may be required to submit Means of Proof at a later stage. When completing the ESPD, bidders musthave regard for the specific selection requirements detailed in Sections III of this OJEU Notice.

Lot Information

FIB-SEM Microscope

This procurement is for supply, installation, initial training and technical services in relation to a cryogenic Dual-Beam Focused Ion Beam Scanning Electron microscope (cryo-FIB-SEM). We intend to procure this equipment in order to establish a multi-user facility focused on the 3D imaging of soft materials, hard materials, soft-hard composites and complex fluids in their native (wet) state. This system will be used by researchers across physics, chemistry and engineering to image and characterise a diverse array of materials, including traditional soft materials (e.g. colloidal suspensions, emulsions, surfactants and polymers), biological systems, hard materials (e.g. diamond anvil cells) and soft/hard composites (e.g. organic-inorganic composites and ice-rubbed interfaces). Cryo-preparation facilities will be used to manipulate and fracture frozen specimens in order to expose internal interfaces and coat specimens to enable high-resolution imaging. Additional detectors will enable elemental analysis (EDX) and crystallographic orientation (EBSD), enhancing our abilities to characterise the composition and interfacial properties of complex, multi-component materials. The microscope will be capable of imaging both conductive and non-conductive specimens. Using the FIB, one will also be able to cut a thin lamella from a specimen and transfer it to a transmission electron microscope (TEM)/cryoTEM grid using a pair of micromanipulators for high-resolution TEM/cryoTEM analysis (atomic resolution). The high-resolution TEM mentioned here is an existing piece of equipment and not part of this tender. The microscope will be equipped with a cryo-stage that will enable the observation of frozen specimens at -170 degC or lower. This will allow the study of naturally hydrated specimens such as supramolecular assemblies of polymers, biological materials such as cells and tissues, emulsions and organic-inorganic composite materials in their native, hydrated state. The cryo-FIB-SEM will be used to slice the specimens in situ to reveal the internal structures and interfaces of an opaque, hydrated soft material, which is not possible with a conventional FIB-SEM. A cryo-preparation chamber will be used to freeze-fracture, freeze-etch and sputter-coat samples for cryo-FIB-SEM. This procurement is divided into Four Lots.. Economic operators may be excluded from this competition if there are any of the situations referred to in regulation 58 of the Public Contracts (Scotland) Regulations 2015.

Options: 1)scanning-transmission electron microscopy (STEM) detector. 2)Freezing system (i.e. High-pressure freezer or nitrogen slusher) for the freezing of samples for cryo-FIB-SEM.

Renewal: The contract period is initially for 12 months with the option to extend for 4 years to cover warranty.

Cryogenic Equipment

As per Lot 1. Economic operators may be excluded from this competition if there are any of the situations referred to inregulation 58 of the Public Contracts (Scotland) Regulations 2015.

Options: As per Lot 1

Renewal: The contract period is initially for 12 months with the option to extend for 4 years to cover warranty.

Energy Dispersive X-ray spectroscopy (EDX) detector

As per Lot 1. Economic operators may be excluded from this competition if there are any of the situations referred to in regulation 58 of the Public Contracts (Scotland) Regulations 2015.

Options: As per Lot 1

Renewal: As per Lot 1

Electron BackScatter Diffraction (EBSD) system

As per Lot 1. Economic operators may be excluded from this competition if there are any of the situations referred to inregulation 58 of the Public Contracts (Scotland) Regulations 2015.

Options: As per Lot 1

Renewal: The contract period is initially for 12 months with the option to extend for 4 years to cover warranty.

Publication & Lifecycle

Open Contracting ID
ocds-r6ebe6-0000507128
Publication Source
Public Contracts Scotland
Latest Notice
https://www.publiccontractsscotland.gov.uk/search/show/search_view.aspx?ID=JAN306297
Current Stage
Award
All Stages
Tender, Award

Procurement Classification

Notice Type
OJEU - F3 - Contract Award Notice
Procurement Type
Standard
Procurement Category
Goods
Procurement Method
Open
Procurement Method Details
Open procedure
Tender Suitability
Not specified
Awardee Scale
Not specified

Common Procurement Vocabulary (CPV)

CPV Divisions

33 - Medical equipments, pharmaceuticals and personal care products

38 - Laboratory, optical and precision equipments (excl. glasses)


CPV Codes

33114000 - Spectroscopy devices

33165000 - Cryosurgical and cryotherapy devices

38511100 - Scanning electron microscopes

38512100 - Ion microscopes

38530000 - Diffraction apparatus

Notice Value(s)

Tender Value
£1,300,000 £1M-£10M
Lots Value
Not specified
Awards Value
Not specified
Contracts Value
Not specified

Notice Dates

Publication Date
10 Jan 20188 years ago
Submission Deadline
11 Sep 2017Expired
Future Notice Date
Not specified
Award Date
27 Nov 20178 years ago
Contract Period
Not specified - Not specified
Recurrence
Not specified

Notice Status

Tender Status
Complete
Lots Status
Complete
Awards Status
Unsuccessful
Contracts Status
Active

Contracting Authority (Buyer)

Main Buyer
University Of Edinburgh
Contact Name
Available with D3 Tenders Premium →
Contact Email
Available with D3 Tenders Premium →
Contact Phone
Available with D3 Tenders Premium →

Buyer Location

Locality
EDINBURGH
Postcode
EH1 1HT
Postcode Area
Edinburgh
Country
Scotland

Major Region (ITL 1)
TLM Scotland
Basic Region (ITL 2)
TLM1 East Central Scotland
Small Region (ITL 3)
TLM13 City of Edinburgh
Delivery Location
TLM75 City of Edinburgh

Local Authority
City of Edinburgh
Electoral Ward
City Centre
Westminster Constituency
Edinburgh East and Musselburgh

Further Information

Notice Documents

  • https://www.publiccontractsscotland.gov.uk/search/show/search_view.aspx?ID=AUG292260
    Cryo-Focused Ion Beam/Scanning Electron Microscope with EDX/EBSD Detectors - University of Edinburgh invites competitive tenders for the supply of a Focused Ion Beam/Scanning Electron Microscope with EDX Detector, Cryo-Stage and TEM Cryo Transfer. Bidders must self-certify their adherence to selection and exclusion criteria via the ESPD (Scotland) on PCS-T.Suppliers may be required to submit Means of Proof at a later stage. When completing the ESPD, bidders musthave regard for the specific selection requirements detailed in Sections III of this OJEU Notice.
  • https://www.publiccontractsscotland.gov.uk/search/show/search_view.aspx?ID=JAN306297
    Cryo-Focused Ion Beam/Scanning Electron Microscope with EDX/EBSD Detectors - University of Edinburgh invites competitive tenders for the supply of a Focused Ion Beam/Scanning Electron Microscope with EDX Detector, Cryo-Stage and TEM Cryo Transfer. Bidders must self-certify their adherence to selection and exclusion criteria via the ESPD (Scotland) on PCS-T.Suppliers may be required to submit Means of Proof at a later stage. When completing the ESPD, bidders musthave regard for the specific selection requirements detailed in Sections III of this OJEU Notice.

Open Contracting Data Standard (OCDS)

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